Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-30T15:37:40.830Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparing Plasma-FIB and Ga-FIB Preparation of Atom Probe Tomography Samples

Published online by Cambridge University Press:  25 July 2016

K Fisher  and
E Marquis
K Fisher
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI
E Marquis
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 692 - 693
Copyright
© Microscopy Society of America 2016 

References

[1] Hugo, R. & Hoagland, R. Scripta Materialia 38 (1998). p. 523.CrossRefGoogle Scholar
[2] Tang, F., et al., Acta Materialia 60 (2012). p. 1038.CrossRefGoogle Scholar
[3] Gault, B, et al., Microscopy and Microanalysis 14 (2008). p. 296.CrossRefGoogle Scholar
[4] The authors would like to acknowledge the Rickover Fellowship in Nuclear Engineering sponsored by the Naval Reactors Division of the U.S. Department of Energy in conjunction with Bettis Laboratory, West Mifflin, PA for funding this research. The authors would also like to acknowledge Tom Nuhfer at Carnegie Mellon University for providing access to the P-FIB and Bryan Miller for training and helpful discussions, and the University of Michigan College of Engineering and the Michigan Center for Materials Characterization for use of the other instruments.Google Scholar