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Comparing different software packages for the mapping of strain from scanning precession diffraction data

Published online by Cambridge University Press:  30 July 2021

Ian MacLaren ,
Emma Devine ,
Hristo Gergov ,
Gary Paterson ,
K. P. Harikrishnan ,
Benjamin Savitzky ,
Colin Ophus ,
Renliang Yuan ,
Jian-Min Zuo  and
Kirsten Forster
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Ian MacLaren
Affiliation:
University of Glasgow, United States
Emma Devine
Affiliation:
University of Glasgow, United Kingdom
Hristo Gergov
Affiliation:
University of Glasgow, United Kingdom
Gary Paterson
Affiliation:
University of Glasgow, Glasgow, Scotland, United Kingdom
K. P. Harikrishnan
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
Benjamin Savitzky
Affiliation:
Lawrence Berkeley National Laboratory, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, California, United States
Renliang Yuan
Affiliation:
University of Illinois at Urbana-Champaign, Illinois, United States
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Kirsten Forster
Affiliation:
University of Glasgow, United Kingdom
Gaja Kobe
Affiliation:
University of Glasgow, United Kingdom
Elizabeth Koppany
Affiliation:
University of Glasgow, United Kingdom
Kirsten McClymont
Affiliation:
University of Glasgow, United Kingdom
Anjelo Narendran
Affiliation:
University of Glasgow, United Kingdom
David Riley
Affiliation:
University of Glasgow, United Kingdom

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2 - 5
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Savitzky, B. H., et al. , arXiv e-prints, arXiv:2003.09523 (2020).Google Scholar
Yuan, R., et al. , Ultramicroscopy 207, 112837 (2019).CrossRefGoogle Scholar
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