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Comparative TEM and HRXRD Analyses of Strain Relaxation in Step-Graded GaInAs Buffer-Layers for High-Efficiency Solar Cells

Published online by Cambridge University Press:  31 July 2006

J Schoene ,
E Spiecker ,
W Jager ,
F Dimroth  and
AW Bett
J Schoene
Affiliation:
Christian-Albrechts-University,Germany
E Spiecker
Affiliation:
Christian-Albrechts-University,Germany
W Jager
Affiliation:
Christian-Albrechts-University,Germany
F Dimroth
Affiliation:
Fraunhofer Institute for Solar Energy Systems ISE,Germany
AW Bett
Affiliation:
Fraunhofer Institute for Solar Energy Systems ISE,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 918 - 919
Copyright
© 2006 Microscopy Society of America