Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-26T09:46:03.042Z Has data issue: false hasContentIssue false
  • English
  • Français

Compact-sized Cutting System for a Serial-block-face Scanning Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Nanami Takagi ,
Norio Yamashita ,
Yuki Tsujimura ,
Hiroshi Takemura ,
Sze Keat Chee ,
Katsuyuki Suzuki ,
Yoshiyuki Kubota  and
Hideo Yokota
Nanami Takagi
Affiliation:
Tokyo University of Science, Department of Mechanical Engineering, United States
Norio Yamashita
Affiliation:
RIKEN, Riken Center for Advanced Photonics, United States
Yuki Tsujimura
Affiliation:
RIKEN, Riken Center for Advanced Photonics, United States
Hiroshi Takemura
Affiliation:
Tokyo University of Science, Department of Mechanical Engineering, United States
Sze Keat Chee
Affiliation:
Mechano Transformer Corporation, United States
Katsuyuki Suzuki
Affiliation:
JEOL Ltd., United States
Yoshiyuki Kubota
Affiliation:
JEOL Ltd., United States
Hideo Yokota
Affiliation:
RIKEN, Riken Center for Advanced Photonics, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy and Microanalysis for Real World Problem Solving
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3176 - 3177
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Wei, D., et al. , BioTechniques. 53 (2012) 41–48.CrossRefGoogle Scholar
Denk, W. and Horstmann, H., PLoS Biology. 2 (2004) e329.CrossRefGoogle Scholar
Heymann, J. A. W., et al. , Journal of Structural Biology. 155 (2006) 63–73.CrossRefGoogle Scholar
Knott, G., et al. , J. Neurosci. 28 (2008) 2959.Google Scholar
Micheva, K. D. and Smith, S. J., Neuron. 55 (2007) 25–36.CrossRefGoogle Scholar
Schalek, R., et al. , Microscopy and Microanalysis. 17 (2011) 966–967CrossRefGoogle Scholar
Nakade, Y., et al. , Proc. 8th Int. Conf. of Asian Society for Precision Engineering and Nanotechnology(ASPEN2019), (2019) A26.Google Scholar
Chee, S. K., et al. , International Journal of Automation Technology. 7 (2013) 71–82.CrossRefGoogle Scholar
Deerinck, TJ, et al. , https://ncmir.ucsd.edu/sbem-protocol (2020.2.10 accessed)Google Scholar
Courson, J. A., et al. , PLOS ONE. 14 (2019) e0224434.CrossRefGoogle Scholar