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Combining SEM/EDS and Raman Microscopy for the Identification of Contaminant Particles in Pharmaceutical Products

Published online by Cambridge University Press:  31 July 2006

P Toepfer  and
G Shearer
P Toepfer
Affiliation:
McCrone Associates,Inc.
G Shearer
Affiliation:
McCrone Associates,Inc.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1646 - 1647
Copyright
© 2006 Microscopy Society of America