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Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1406 - 1407
- Copyright
- © Microscopy Society of America 2016
References
[3]
Salmon, J., et al,
Journal of mathematical imaging and vision
48
(2014). p. 279–294.CrossRefGoogle Scholar
[5] This work was supported by the US Department of Energy, Basic Energy Sciences, under grant DE-FG02-08ER46547.Google Scholar
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