Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T11:10:36.614Z Has data issue: false hasContentIssue false

Combining Atomic-Scale EDX with Inelastic Multislice Simulations for Quantitative Chemical Analysis of AlGaN/GaN 1 nm-thick Quantum Wells

Published online by Cambridge University Press:  22 July 2022

Florian Castioni*
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Sergi Cuesta
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
Nicolas Bernier
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Patrick Quéméré
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Eric Robin
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
Vincent Delaye
Affiliation:
 Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
Eva Monroy
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
Pascale Bayle-Guillemaud
Affiliation:
 Univ. Grenoble Alpes, CEA, IRIG, Grenoble, France
*
*Corresponding author: [email protected]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Copyright
Copyright © Microscopy Society of America 2022

References

Asif Khan, M. et al. , Jpn. J. Appl. Phys. 44 (2005) 71917206. https://doi.org/10.1143/JJAP.44.7191.CrossRefGoogle Scholar
Liu, J., Microsc Microanal. 27 (2021) 943995. https://doi.org/10.1017/S1431927621012125.CrossRefGoogle Scholar
Lugg, N.R. et al. , Ultramicroscopy. 151 (2015) 150159. https://doi.org/10.1016/j.ultramic.2014.11.029.CrossRefGoogle Scholar
Nguyen, D.T., Findlay, S.D., Etheridge, J., Ultramicroscopy. 146 (2014) 616. https://doi.org/10.1016/j.ultramic.2014.04.008.CrossRefGoogle Scholar
Allen, L.J., D׳Alfonso, A.J., Findlay, S.D., Ultramicroscopy. 151 (2015) 1122. https://doi.org/10.1016/j.ultramic.2014.10.011.CrossRefGoogle Scholar
This work, done on the NanoCharacterisation PlatForm (PFNC), was supported by the “Recherches Technologiques de Base” Program of the French Ministry of Research.Google Scholar