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Combining ADF-EDX scattering cross-sections for elemental quantification of nanostructures

Published online by Cambridge University Press:  30 July 2021

Zezhong Zhang ,
Annick De Backer ,
Ivan Lobato ,
Sandra Van Aert  and
Peter Nellist
Zezhong Zhang
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium, Belgium
Annick De Backer
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium, Belgium
Ivan Lobato
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium, Belgium
Sandra Van Aert
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium, Belgium
Peter Nellist
Affiliation:
University of Oxford, Department of Materials, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 600 - 602
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

LeBeau, J.M., Findlay, S.D., Allen, L.J., Stemmer, S., Nano Letters 10 (2010) p. 4405–4408.CrossRefGoogle Scholar
De Backer, A., van den Bos, K.H.W., Van den Broek, W., Sijbers, J., and Van Aert, S., Ultramicroscopy 171 (2016) p. 104-116.CrossRefGoogle Scholar
van den Bos, K.H.W., De Backer, A., Martinez, G.T., Winckelmans, N., Bals, S., Nellist, P.D., Van Aert, S., Physical Review Letters 116 (2016) p. 246101.CrossRefGoogle Scholar
Varambhia, A., Jones, L., London, A., Ozkaya, D., Nellist, P.D., & Lozano-Perez, S., Micron 113 (2018) p. 69-82.CrossRefGoogle Scholar
The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through Project No. G.0502.18N and a post-doctoral grant to ADB. This project has received funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation programme (Grant Agreement No. 770887 PICOMETRICS and No. 823717 ESTEEM3).Google Scholar