Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-27T09:59:02.598Z Has data issue: false hasContentIssue false
  • English
  • Français

Combined SIMS-SPM Instrument for High Sensitivity and High Resolution Elemental 3D Analysis

Published online by Cambridge University Press:  09 October 2013

Y. Fleming ,
T. Wirtz ,
D. Dowsett ,
M. Gerard ,
U. Gysin ,
T. Glatzel ,
E. Meyer ,
U. Maier  and
U. Wegmann
Y. Fleming
Affiliation:
T. Wirtz
Affiliation:
D. Dowsett
Affiliation:
M. Gerard
Affiliation:
U. Gysin
Affiliation:
T. Glatzel
Affiliation:
E. Meyer
Affiliation:
U. Maier
Affiliation:
U. Wegmann
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 668 - 669
Copyright
Copyright © Microscopy Society of America 2013