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Combined Scanning Probe Microscopy and Confocal Raman Spectroscopy for Functional Imaging of the Layered Materials

Published online by Cambridge University Press:  25 July 2016

Anton V. Ievlev ,
Michael A. Susner ,
Michael A. McGuire ,
Petro Maksymovych  and
Sergei V. Kalinin
Anton V. Ievlev
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Michael A. Susner
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Michael A. McGuire
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Petro Maksymovych
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 218 - 219
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] Schönenberger, C. & Alvarado, S. F. Phys. Rev. Lett. 65 (1990). p. 3162.Google Scholar
[3] Kalinin, S.V., et.al., Rep. Prog Phys 73 (2010). p. 056502.Google Scholar
[4] Ievlev, A.V., et.al, ACS Nano 9(12 (2015). p. 12442.Google Scholar
[5] Research supported by Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility.Google Scholar