We present a novel combined atomic force microscope (AFM) and confocal laser scanning microscope (CLSM). The sample is supported from the side by a boom from a piezo tube scanner, allowing top and bottom access to the sample. The sample is scanned above an inverted microscope objective with a fixed optical path for fluorescent CLSM imaging. An AFM positioned directly above the sample simultaneously measures surface topography. The piezo tube scanner is angled, placing its center of scan curvature directly above the microscope objective. This geometry allows flat scans up to 300 μm on a side. Because the sample is scanned, the AFM and CLSM images are acquired in direct registration.