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Column-by-Column Imaging of Dislocation Slip Processes in CdTe

Published online by Cambridge University Press:  27 August 2014

Chen Li
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Chemistry, Vanderbilt University, Nashville, TN, USA
Yelong Wu
Affiliation:
Department of Physics and Astronomy, The University of Toledo, Toledo, OH, USA
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Naba Paudel
Affiliation:
Department of Physics and Astronomy, The University of Toledo, Toledo, OH, USA
Yanfa Yan
Affiliation:
Department of Physics and Astronomy, The University of Toledo, Toledo, OH, USA
Stephen J. Pennycook
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Bulato, V. V., et al, Philos. Mag. A 81, 1257 (2001).Google Scholar
[2] Li, C., et al, Ultramicroscopy 134, 113 (2013).Google Scholar
[3] Li, C., et al, Phys. Rev. Lett. 111, 096403 (2013).Google Scholar
[4] This research was sponsored by the US DOE, Office of Energy Efficiency and Renewable Energy, Foundational Program to Advance Cell Efficiency (CL, YW, NP, YY, SJP), the Office of DOE-BES, Materials Science and Engineering Division (ARL), and a user project supported by ORNL’s Center for Nanophase Materials Sciences (CNMS), which is also sponsored by DOE-BES.Google Scholar