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Collecting and Analysing - 1.6eV - 20keV Emission Spectra in an EPMA

Published online by Cambridge University Press:  25 July 2016

C.M. MacRae ,
N.C. Wilson ,
A. Torpy ,
J. Bergmann  and
H. Takahashi
C.M. MacRae
Affiliation:
CSIRO Mineral Resources, Private Bag 10, Clayton South, Vic, Australia
N.C. Wilson
Affiliation:
CSIRO Mineral Resources, Private Bag 10, Clayton South, Vic, Australia
A. Torpy
Affiliation:
CSIRO Mineral Resources, Private Bag 10, Clayton South, Vic, Australia
J. Bergmann
Affiliation:
Bruker Pty Ltd, PO Box 8432, Northland Centre, Vic, Australia
H. Takahashi
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 410 - 411
Copyright
© Microscopy Society of America 2016 

References

[1] Terauchi, M., et al.. (2012). Journal of Electron Microscopy 61(1), 1–8.Google Scholar
[2] Burgess, , et al.. (2014). Microscopy & Microanalysis 20(Suppl. 3), 898–899.Google Scholar
[3] We acknowledge support from ARC - LE130100087.Google Scholar
[4] Terauchi, M., et al., Handbook of Soft X-ray Emission Spectra. JEOL Ltd.Google Scholar
[5] MacRae, C.M. & Wilson, N.C. (2008). Microscopy & Microanalysis 14, 184–204.Google Scholar