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Circumferential FIB Milling for Lift-Out Specimens

Published online by Cambridge University Press:  31 July 2006

LA Giannuzzi ,
PA Anzalone ,
RJ Young  and
DW Phifer
LA Giannuzzi
Affiliation:
FEI Company
PA Anzalone
Affiliation:
FEI Company
RJ Young
Affiliation:
FEI Company
DW Phifer
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1310 - 1311
Copyright
© 2006 Microscopy Society of America