Hostname: page-component-7bb8b95d7b-qxsvm Total loading time: 0 Render date: 2024-09-15T12:17:41.072Z Has data issue: false hasContentIssue false
  • English
  • Français

Chemical characterization of optical data storage materials by EPMA

Published online by Cambridge University Press:  01 August 2002

S. Richter ,
M. Bückins ,
S. Kyrsta  and
R. Cremer
S. Richter
Affiliation:
Central Facility of Electron Microscopy, RWTH Aachen, 52056 Aachen, Germany
M. Bückins
Affiliation:
Central Facility of Electron Microscopy, RWTH Aachen, 52056 Aachen, Germany
S. Kyrsta
Affiliation:
Lehrstuhl f�r Theoretische H�ttenkunde, RWTH Aachen, 52056 Aachen, Germany
R. Cremer
Affiliation:
Lehrstuhl f�r Theoretische H�ttenkunde, RWTH Aachen, 52056 Aachen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1488 - 1489
Copyright
Copyright © Microscopy Society of America 2002