Hostname: page-component-7bb8b95d7b-dvmhs Total loading time: 0 Render date: 2024-09-12T19:06:14.196Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterizing the performance of the FEI Titan environmental Transmission Electron Microscope / scanning Transmission Electron Microscope

Published online by Cambridge University Press:  01 August 2010

EA Stach ,
SM Kim ,
DN Zakharov ,
Y Zvinevich ,
FH Riberio ,
L Miller ,
R Colby ,
NJ Salmon  and
B Kabius
EA Stach
Affiliation:
Purdue University
SM Kim
Affiliation:
Purdue University
DN Zakharov
Affiliation:
Purdue University
Y Zvinevich
Affiliation:
Purdue University
FH Riberio
Affiliation:
Purdue University
L Miller
Affiliation:
Purdue University
R Colby
Affiliation:
Purdue University
NJ Salmon
Affiliation:
Hummingbird Scientific
B Kabius
Affiliation:
Argonne National Laboratory

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 294 - 295
Copyright
Copyright © Microscopy Society of America 2010