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Characterization of Sub-Bandgap Plasmon Excitations in Transparent Conducting Oxides with Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Julia I. Deitz ,
John M. Walls ,
Jake W. Bowers ,
Tyler J. Grassman  and
David W. McComb
Julia I. Deitz*
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, United States.
John M. Walls
Affiliation:
Centre for Renewable Energy Systems Technology, Dept. of Mechanical, Electrical and Manufacturing Engineering, Loughborough University, Loughborough, Leicestershire, UK.
Jake W. Bowers
Affiliation:
Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, USA.
Tyler J. Grassman
Affiliation:
Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, USA. Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, United States. Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 600 - 601
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Gwamuri, J et al. , Mater. Renew. Sustain. Energy 4 (2015), p. 12.Google Scholar
[2]Granerød, CS et al. , Phys. Rev. B 98, (2018), p. 115301.Google Scholar