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Characterization of Porous GaN-Nanostructured Rods by TEM Techniques

Published online by Cambridge University Press:  31 July 2006

J-G Zheng
Affiliation:
Northwestern University
S Ding
Affiliation:
Sun Yat-Sen (Zhongshan) University
M Wu
Affiliation:
Sun Yat-Sen (Zhongshan) University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Copyright
© 2006 Microscopy Society of America