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Characterization of Nickel Oxide Nanoplates Using STEM Tomography and In-situ Electron Microscopy

Published online by Cambridge University Press:  08 April 2017

A Shukla ,
P Ercius ,
A Gautam ,
J Cabana  and
U Dahmen
A Shukla
Affiliation:
Lawrence Berkeley National Laboratory
P Ercius
Affiliation:
Lawrence Berkeley National Laboratory
A Gautam
Affiliation:
Lawrence Berkeley National Laboratory
J Cabana
Affiliation:
Lawrence Berkeley National Laboratory
U Dahmen
Affiliation:
Lawrence Berkeley National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 936 - 937
Copyright
Copyright © Microscopy Society of America 2011