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Characterization of Modulated Nanostructure in Au-Pt Alloy using Aberration Corrected STEM
Published online by Cambridge University Press: 22 July 2022
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- Advanced Imaging and Spectroscopy for Nanoscale Materials
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- Copyright © Microscopy Society of America 2022
References
Crewe, A. V. et al. (1975), p. 47 in Physical Aspects of Electron Microscopy and Microbeam Analysis, ed. by Siegel and Beaman, Wiley, New York.Google Scholar
Krivanek, O. L. et al. (2008), Ultramicros.108, 179-195.10.1016/j.ultramic.2007.07.010CrossRefGoogle Scholar
The authors acknowledge funding from the Division of Materials Research of the National Science Foundation, and the use of facilities within the John M. Cowley Center for High-Resolution Electron Microscopy at Arizona State University.Google Scholar
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