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Characterization of Layer Thickness and Orientation of 2D WSe2/MoS2 Heterostructures using EDS, EBSD and AFM

Published online by Cambridge University Press:  23 September 2015

Christian Lang ,
Matthew Hiscock ,
Kim Larsen ,
Jonathan Moffat  and
Ravi Sundaram
Christian Lang
Affiliation:
Oxford Instruments Nanoanalysis, High WycombeUK
Matthew Hiscock
Affiliation:
Oxford Instruments Nanoanalysis, High WycombeUK
Kim Larsen
Affiliation:
Oxford Instruments Nanoanalysis, High WycombeUK
Jonathan Moffat
Affiliation:
Asylum Research, High WycombeUK
Ravi Sundaram
Affiliation:
Oxford Instruments Plasma Technology, YattonUK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 103 - 104
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Butler, S.Z., et al., ACS Nano 7 (2013). p. 2898.CrossRefGoogle Scholar
[2] Lang, C., et al., Microscopy and Microanalysis 19 (2013). p. 1872.CrossRefGoogle Scholar