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Characterization of Layer Thickness and Orientation of 2D WSe2/MoS2 Heterostructures using EDS, EBSD and AFM

Published online by Cambridge University Press:  23 September 2015

Christian Lang
Affiliation:
Oxford Instruments Nanoanalysis, High WycombeUK
Matthew Hiscock
Affiliation:
Oxford Instruments Nanoanalysis, High WycombeUK
Kim Larsen
Affiliation:
Oxford Instruments Nanoanalysis, High WycombeUK
Jonathan Moffat
Affiliation:
Asylum Research, High WycombeUK
Ravi Sundaram
Affiliation:
Oxford Instruments Plasma Technology, YattonUK

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Butler, S.Z., et al., ACS Nano 7 (2013). p. 2898.CrossRefGoogle Scholar
[2] Lang, C., et al., Microscopy and Microanalysis 19 (2013). p. 1872.CrossRefGoogle Scholar