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characterization of graphene and BN nano sheets by helium ion microscopy

Published online by Cambridge University Press:  23 November 2012

H. Guo
Affiliation:
National Institute for Materials Science, Japan, Tsukuba, Japan
J. Gao
Affiliation:
National Institute for Materials Science, Japan, Tsukuba, Japan
D. Fujita
Affiliation:
National Institute for Materials Science, Japan, Tsukuba, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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