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Characterization of directionally recrystallized cold-rolled nickel using EBSP

Published online by Cambridge University Press:  01 August 2002

B. Iliescu ,
J. Li  and
I. Baker
B. Iliescu
Affiliation:
Thayer School of Engineering, Dartmouth College, Hanover, NH 03755, USA
J. Li
Affiliation:
Thayer School of Engineering, Dartmouth College, Hanover, NH 03755, USA
I. Baker
Affiliation:
Thayer School of Engineering, Dartmouth College, Hanover, NH 03755, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1264 - 1265
Copyright
Copyright © Microscopy Society of America 2002