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Characterization of Darai Limestone Composition and Porosity Using Data-Constrained Modeling and Comparison with Xenon K-Edge Subtraction Imaging

Published online by Cambridge University Press:  29 May 2015

Sheridan C. Mayo ,
Sam Y.S. Yang ,
Marina Pervukhina ,
Michael B. Clennell ,
Lionel Esteban ,
Sarah C. Irvine ,
Karen K. Siu ,
Anton S. Maksimenko  and
Andrew M. Tulloh
Sheridan C. Mayo*
Affiliation:
CSIRO Manufacturing Flagship, Private Bag 10, Clayton, VIC 3169, Australia
Sam Y.S. Yang
Affiliation:
CSIRO Manufacturing Flagship, Private Bag 10, Clayton, VIC 3169, Australia
Marina Pervukhina
Affiliation:
CSIRO Energy Flagship, P.O. Box 1130, Bentley, WA 6102, Australia
Michael B. Clennell
Affiliation:
CSIRO Energy Flagship, P.O. Box 1130, Bentley, WA 6102, Australia
Lionel Esteban
Affiliation:
CSIRO Energy Flagship, P.O. Box 1130, Bentley, WA 6102, Australia
Sarah C. Irvine
Affiliation:
Swiss Light Source, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Department of Mechanical & Aerospace Engineering, Monash University, Wellington Road, Clayton, VIC 3800, Australia
Karen K. Siu
Affiliation:
Australian Synchrotron, 800 Blackburn Rd, Clayton, VIC 3168, Australia School of Physics, Monash University, Wellington Rd, Clayton VIC 3800, Australia
Anton S. Maksimenko
Affiliation:
Australian Synchrotron, 800 Blackburn Rd, Clayton, VIC 3168, Australia
Andrew M. Tulloh
Affiliation:
CSIRO Manufacturing Flagship, Private Bag 10, Clayton, VIC 3169, Australia
*
*Corresponding author. [email protected]
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Abstract

Data-constrained modeling is a method that enables three-dimensional distribution of mineral phases and porosity in a sample to be modeled based on micro-computed tomography scans acquired at different X-ray energies. Here we describe an alternative method for measuring porosity, synchrotron K-edge subtraction using xenon gas as a contrast agent. Results from both methods applied to the same Darai limestone sample are compared. Reasonable agreement between the two methods and with other porosity measurements is obtained. The possibility of a combination of data-constrained modeling and K-edge subtraction methods for more accurate sample characterization is discussed.

Keywords

data-constrained modelingmicro-CTK-edge subtractionporositysynchrotron
Type
Materials Applications and Techniques
Information
Microscopy and Microanalysis , Volume 21 , Issue 4 , August 2015 , pp. 961 - 968
Copyright
© Microscopy Society of America 2015 

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