Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-06T05:07:44.347Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Bi1.5ZnNb1.5O7-x Pyrochlore Thin Films by High-angle Annular Dark-field Imaging in STEM

Published online by Cambridge University Press:  01 August 2005

D O Klenov ,
J Lu ,
S Schmidt  and
S Stemmer
D O Klenov
Affiliation:
University of California Santa Barbara
J Lu
Affiliation:
University of California Santa Barbara
S Schmidt
Affiliation:
University of California Santa Barbara
S Stemmer
Affiliation:
University of California Santa Barbara

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1732 - 1733
Copyright
© 2005 Microscopy Society of America