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Characterization of Abrupt Heterojunctions in SiGe NW using Off-Axis Electron Holography

Published online by Cambridge University Press:  09 October 2013

Z. Gan ,
D. Perea ,
T. Picraux ,
D. Smith  and
M. McCartney
Z. Gan
Affiliation:
D. Perea
Affiliation:
T. Picraux
Affiliation:
D. Smith
Affiliation:
M. McCartney
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1386 - 1387
Copyright
Copyright © Microscopy Society of America 2013