Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-27T07:31:09.947Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization and Nanoscale Strain Analysis of Surface Modified Layer in Y2O3

Published online by Cambridge University Press:  01 August 2010

JF Al-Sharab ,
BH Kear ,
S Deutsch  and
SD Tse
JF Al-Sharab
Affiliation:
Rutgers University
BH Kear
Affiliation:
Rutgers University
S Deutsch
Affiliation:
Rutgers University
SD Tse
Affiliation:
Rutgers University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1278 - 1279
Copyright
Copyright © Microscopy Society of America 2010