Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T05:21:47.922Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization and analysis of heteroepitaxial growth on silicon structures

Published online by Cambridge University Press:  19 July 2003

Ganesh Vanamu ,
Abhaya K. Datye ,
Andy Allerman  and
Saleem H. Zaidi
Ganesh Vanamu
Affiliation:
Department of chemical and nuclear engineering, University of New Mexico, Albuquerque, NM-87131
Abhaya K. Datye
Affiliation:
Department of chemical and nuclear engineering, University of New Mexico, Albuquerque, NM-87131
Andy Allerman
Affiliation:
Gratings, Inc., 2700 B Broadbent Pkwy., N.E, Albuquerque, NM 87107
Saleem H. Zaidi
Affiliation:
Gratings, Inc., 2700 B Broadbent Pkwy., N.E, Albuquerque, NM 87107

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 372 - 373
Copyright
Copyright © Microscopy Society of America 2003