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Characteristics of Secondary Electron Images From In-lens and Conventional Everhart-Thornley Detectors - Evidence for the Energy-based Differentiation of High Resolution SE1 and Delocalized SE2 Signals

Published online by Cambridge University Press:  26 July 2009

BJ Griffin ,
DC Joy  and
JR Michael
BJ Griffin
Affiliation:
The University of Western Australia
DC Joy
Affiliation:
Oak Ridge National Laboratory
JR Michael
Affiliation:
Sandia National Laboratories

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 46 - 47
Copyright
Copyright © Microscopy Society of America 2009