Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-20T16:24:52.090Z Has data issue: false hasContentIssue false

Characterising the Morphology of Polymer Articles Using Polarised FTIR Reflectance and Raman Microscopies.

Published online by Cambridge University Press:  02 July 2020

N.J. Everall
Affiliation:
ICI Research and Technology Centre, P.O. Box 90, Wilton, Middlesbrough, Cleveland, TS908JE, UK.
J.M. Chalmers
Affiliation:
ICI Research and Technology Centre, P.O. Box 90, Wilton, Middlesbrough, Cleveland, TS908JE, UK.
Get access

Extract

The optical and mechanical performance of polymer articles is often very strongly influenced by the crystallinity and degree of molecular orientation in the polymer. It is therefore important to have available techniques for measuring and mapping these parameters over article surfaces and through wall thicknesses, on scales from centimetres to microns. It is also desirable that these techniques do not in themselves perturb the morphology of the polymer, for example by introducing excess orientation or crystallinity through sectioning.

In this paper we will show how Raman microscopy can provided a useful approach for mapping polymer crystallinity on the micron scale, particularly when coupled with multivariate calibration techniques for data analysis. The acquisition and treatment of data to obtain crystallinity information will be described in detail. We will also describe the development and application of polarised FTIR specular reflectance and attenuated total reflection (ATR) microbeam techniques for quantifying and mapping surface orientation of polymer articles.

Type
Optical Microanalysis
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Everall, N.J., Davis, K., Owen, H., Pelletier, M.J., and J Slater Appl. Spectrosc. 50(1996)388.10.1366/0003702963906258CrossRefGoogle Scholar
2Williams, K.J.P.and Everall, N., J. Raman. Spectrosc. 26(1995)427.10.1002/jrs.1250260606CrossRefGoogle Scholar
3Everall, N.J.and Bibby, A., Appl. Spectrosc, in press.Google Scholar
4Mirabella, F.M., Appl. Spectrosc, 42(1988)1258.10.1366/0003702884430092CrossRefGoogle Scholar