Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-25T02:11:47.346Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterisation of Planar Defects in Ternary Layered Chalcogenides for Electronic Devices

Published online by Cambridge University Press:  22 July 2022

Tigran Simonian ,
Ahin Roy ,
Zdenek Sofer  and
Valeria Nicolosi
Tigran Simonian*
Affiliation:
Advanced Microscopy Centre, CRANN & AMBER, Grand Canal Quay, Trinity College Dublin, Ireland School of Chemistry, Trinity College Dublin, Ireland
Ahin Roy
Affiliation:
Advanced Microscopy Centre, CRANN & AMBER, Grand Canal Quay, Trinity College Dublin, Ireland School of Chemistry, Trinity College Dublin, Ireland
Zdenek Sofer
Affiliation:
Department of Inorganic Chemistry, University of Chemistry and Technology, Prague, Czechia
Valeria Nicolosi
Affiliation:
Advanced Microscopy Centre, CRANN & AMBER, Grand Canal Quay, Trinity College Dublin, Ireland School of Chemistry, Trinity College Dublin, Ireland
*
*Corresponding Author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2392 - 2393
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Nicolosi, V. et al. , Science 340 (2013), p. 72.10.1126/science.1226419CrossRefGoogle Scholar
Cengiz, A. et al. , Semicond. Sci. Technol. 33 (2018).10.1088/1361-6641/aac97bCrossRefGoogle Scholar
Duman, S. and Gürbulak, B., Phys. Scr. 72 (2005), p. 79.10.1238/Physica.Regular.072a00079CrossRefGoogle Scholar
Shim, Y., Kawabata, T., Wakita, K. and Mamedov, N., Phys. Status Solidi B, 252 (2015), p. 1254.10.1002/pssb.201400342CrossRefGoogle Scholar