Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-27T10:45:20.845Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterisation of Misfit Dislocations at Semicoherent Interfaces in Biphasic Functional Heusler Intermetallics

Published online by Cambridge University Press:  05 August 2019

YM Eggeler ,
EE Levin ,
F Wang ,
R Seshadri ,
TM Pollock  and
DS Gianola
YM Eggeler*
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
EE Levin
Affiliation:
Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
F Wang
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
R Seshadri
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
TM Pollock
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
DS Gianola
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1916 - 1917
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Graf, T, Felser, C and Parkin, SS, Prog. Sol. St. Chem. 39 (2011), p. 1.Google Scholar
[2]Levin, EE et al. , Materials 11 (2018), p. 903.Google Scholar
[3]Verma, N et al. , Metallurgical and Materials Transactions A (2016), p. 4116.Google Scholar
[4]Buffon, ML et al. , Journal of Applied Physics (2016), p. 075104.Google Scholar
[5]Pochet, P et al. , Applied Materials Today (2017), p. 240.Google Scholar