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Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale
Published online by Cambridge University Press: 27 August 2014
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- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 146 - 147
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- Copyright © Microscopy Society of America 2014
References
[9]
Kirkland, E.J. Advanced Computing in Electron Microscopy, (Springer, New York (2010).Google Scholar
[11] This research was supported by NSF DMR-1006706. Simulations were performed using Minnesota Supercomputing Institute resources. Drs. M. Cococcioni and B. Himmetoglu are thanked for density functional theory calculations of bonding charge density.Google Scholar
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