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Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS

Published online by Cambridge University Press:  27 August 2014

P. A. Crozier ,
J. Zhu ,
T. Aoki ,
P. Rez ,
W. J. Bowman ,
R.W. Carpenter ,
O.L. Krivanek ,
N. Dellby ,
T.C. Lovejoy  and
R.F. Egerton
P. A. Crozier
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287, USA
J. Zhu
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287, USA LeRoy Erying Center for Solid State Science, Arizona State University, Tempe, AZ 85287, USA
T. Aoki
Affiliation:
LeRoy Erying Center for Solid State Science, Arizona State University, Tempe, AZ 85287, USA
P. Rez
Affiliation:
Department of Physics, ASU, Tempe, AZ 85287, USA
W. J. Bowman
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287, USA
R.W. Carpenter
Affiliation:
LeRoy Erying Center for Solid State Science, Arizona State University, Tempe, AZ 85287, USA
O.L. Krivanek
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
N. Dellby
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
T.C. Lovejoy
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
R.F. Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton T6G 2E1, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 72 - 73
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Krivanek, O.L., et al, these proceedings (2014).Google Scholar
[2] Zhu, J. et al, these proceedings (2014).Google Scholar
[3] The authors acknowledge support of the NIST 60NANB10D022, NSF Graduate Research Fellowship Program (DGE-1311230), NSF DMR 1308085, NSF MRI-R2 959905 and DOE DE-SC0004954. The authors acknowledge the use of facilities in the John M. Cowley Center for High Resolution Microscopy at Arizona State University.Google Scholar