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Certified Reference Material for Strain Measurement Using EBSD

Published online by Cambridge University Press:  23 September 2015

M.D. Vaudin ,
W.A. Osborn ,
L.H. Friedman  and
K. Siebein
M.D. Vaudin
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA
W.A. Osborn
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA
L.H. Friedman
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA
K. Siebein
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1895 - 1896
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[4] Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar
[5] Kacher, J, Landon, C, Adams, BL & Fullwood, D, Ultramicroscopy 109(9 (2009). p 1148.Google Scholar
[6] Brigham Young University 2015). OpenXY V1.0, github.com.Google Scholar
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