Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-26T01:43:00.418Z Has data issue: false hasContentIssue false
  • English
  • Français

CBED Study of Mn3+ Orbital Ordering in LaMnO3

Published online by Cambridge University Press:  02 July 2020

B. Jiang ,
J.M. Zuo ,
Q. Chen ,
S-W Cheong  and
J.C.H. Spence
B. Jiang
Affiliation:
Department of Physics & Astronomy, Arizona State University, Tempe, AZ85287
J.M. Zuo
Affiliation:
Department of Physics & Astronomy, Arizona State University, Tempe, AZ85287
Q. Chen
Affiliation:
Department of Physics & Astronomy, Arizona State University, Tempe, AZ85287
S-W Cheong
Affiliation:
Lucent Technologies, Murray Hill, New Jersey, 07974
J.C.H. Spence
Affiliation:
Department of Physics & Astronomy, Arizona State University, Tempe, AZ85287
Get access

Extract

Mn oxides of pervoskite-related structure containing Mn ions have attracted considerable interest due to the colossal magnetoresistence (CMR) effect. Doping the family of compounds La1-x Cax MnO3 with divalent Ca ion oxidizes Mn+3 to Mn4+, introducing holes in the 3d bond orbital that give rise to a series of interesting physical properties. The parent compound LaMnO3 (Pbnm) with unit cell of a=5.5367Å b=5.7473Å and c=7.6929Å, is an antiferromagnetic insulator in which orbital ordering is established due to the cooperative Jahn-Teller (JT) effect breaking the degeneracy of the electronic configuration of Mn3+ (t2g3eg1). This particular C-type orbital ordering is responsible for the A-type magnetic structure observed by Wollen and Kohler. Theoretical Monte-Carlo simulation has shown that the A-type antiferromagnetic state is stable in a model based on JT phonons, using coupling values physically reasonable for LaMnO3 and considering the small but important effect of octahedral tilting.

Type
Sir John Meurig Thomas Symposium: Microscopy and Microanalysis in the Chemical Sciences
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 46 - 47
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Carvajal, J.R. et al, Phys. Rev. B, 57. R3189(1998)Google Scholar
2.Von Helmolt, R. et al, Phys. Rev. Lett., 77. 2331(1993)CrossRefGoogle Scholar
3.Wollan, E.O. and Koehler, W.C., Phys. Rev., 100, 545(1955)CrossRefGoogle Scholar
4.Hotta, T. et al, Phys. Rev. B 60, R 15009(1998)CrossRefGoogle Scholar
5.Murakami, Y. et al, Phys. Rev. Lett., 81, 582(1998); 80, 1932(1998)CrossRefGoogle Scholar
6.Zuo, J.M., Mater. Trans. JIM, 39, 938(1998)CrossRefGoogle Scholar
7.Zuo, J.M., Kim, M., O'Keeffe, M. and Spence, J.C.H., Nature, 401, 49(1999)CrossRefGoogle Scholar
8.Freeman, A.J., Acta Crys., 12, 261(1959), Weiss, R.J. and Freeman, A.J., Acta Crys., 10, 147(1959)CrossRefGoogle Scholar
9. International tables for X-ray Crystallography, Vol IV, pi 14 (1974)Google Scholar