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Causal Analysis of Parameterized Atomic HAADF-STEM Across a Doped Ferroelectric Phase Boundary

Published online by Cambridge University Press:  30 July 2021

Christopher Nelson ,
Maxim Ziatdinov ,
Xiaohang Zhang ,
Rama Vasudevan ,
Eugen Eliseev ,
Anna Morozovska ,
Ichiro Takeuchi  and
Sergei Kalinin
Christopher Nelson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Maxim Ziatdinov
Affiliation:
Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Xiaohang Zhang
Affiliation:
3University of Maryland, Maryland, United States
Rama Vasudevan
Affiliation:
Oak Ridge National Laboratory, United States
Eugen Eliseev
Affiliation:
Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, United States
Anna Morozovska
Affiliation:
Institute of Physics, National Academy of Sciences of Ukraine, United States
Ichiro Takeuchi
Affiliation:
3University of Maryland, Maryland, United States
Sergei Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2762 - 2764
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Daniusis, P. et al. , Proceedings of the 26th Conference on Uncertainty in Artificial Intelligence (UAI) 7 (2010), 1.Google Scholar
Shimizu, S. et al. , Mach. Learn. Res. 7 (2006), p. 2003Google Scholar
This work was supported by the U.S Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division.Google Scholar