Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-20T14:32:37.938Z Has data issue: false hasContentIssue false
  • English
  • Français

Cathodoluminescence Microcharacterization of the Irradiation Sensitive Defect Structure of Amorphous Silicon Dioxide

Published online by Cambridge University Press:  02 July 2020

M.A. Stevens Kalceff ,
M.R. Phillips  and
A.R. Moon
M.A. Stevens Kalceff
Affiliation:
Microstructural Analysis Unit, University of Technology, Sydney, PO 123, Broadway NSW 2007, [email protected]
M.R. Phillips
Affiliation:
Microstructural Analysis Unit, University of Technology, Sydney, PO 123, Broadway NSW 2007, [email protected]
A.R. Moon
Affiliation:
Microstructural Analysis Unit, University of Technology, Sydney, PO 123, Broadway NSW 2007, [email protected]
Get access

Extract

Cathodoluminescence (CL) Microscopy (imaging) and Spectroscopy in a Scanning Electron Microscope enables high spatial resolution, high sensitivity detection of defect centers in materials. Cathodoluminescence microanalysis has been used to investigate the irradiation sensitive defect structure of Types I, II, III and IV amorphous silicon dioxide SiO2 (quartz and silica glasses). The CL experiments were performed in a JEOL JSM 35C SEM equipped with Oxford Instruments liquid N and liquid He cryogenic stages, and an Oxford Instruments MonoCL cathodoluminescence imaging and spectral analysis system. The observed CL emissions, were excited with a stationary electron beam at normal incidence and corrected for total instrument response. The corrected CL spectra were fitted with a multiparameter Gaussian function using a non linear least squares curve fitting algorithm and were identified with particular defect structures. The CL emission from high quality pure amorphous silica and quartz glasses is dominated by intrinsic processes (associated with the host lattice). See Table 1.

Type
Ceramics and Ceramic Composites
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 751 - 752
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Refeences

Remond, G., et al., Scanning Microscopy 6( 1992)23.Google Scholar
Specimens obtained from National Scientific Co., Quakertown, PA USA., TSL Group PLC. Wallsend UK, and Heraeus, Hanau Germany.Google Scholar
Stevens Kalceff, M.A. and Phillips, M.R., Phys.Rev.B 52(1995) 3122.10.1103/PhysRevB.52.3122CrossRefGoogle Scholar
Heaney, P.J., Prewitt, C.T. and Gibbs, G.V. (eds), “Silica” Reviews in Mineralogy Vol 29 (1994) Mineralogical Society of America, Washington DC.Google Scholar
Griscom, D.L., J.Non-Crysl.Sol. 73( 1985)51.10.1016/0022-3093(85)90337-0CrossRefGoogle Scholar
Griscom, D.L., J.Ceram.Soc.Jpn. 99( 1991)923.10.2109/jcersj.99.923CrossRefGoogle Scholar
Munekuni, T., et al., J.Appl. Phys. 68(1990)1212.10.1063/1.346719CrossRefGoogle Scholar
Stevens Kalceff, M.A.et al., J.Appl.Phys. 80 (1996)4308.10.1063/1.363379CrossRefGoogle Scholar
O'Reilly, E.P. and Robertson, J., Phys.Rev.B 27(1983)3780.10.1103/PhysRevB.27.3780CrossRefGoogle Scholar
Skuja, L.. J.Non-Cryst.Sol. 149(1992)77.10.1016/0022-3093(92)90056-PCrossRefGoogle Scholar