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Carbon Nanotube - Substrate Interface Characteristics Studied via TEM

Published online by Cambridge University Press:  31 July 2006

TS Zheleva ,
SJ Kilpatrick ,
MH Ervin ,
X Li ,
A Cao  and
PM Ajayan
TS Zheleva
Affiliation:
U.S. Army Research Laboratory
SJ Kilpatrick
Affiliation:
U.S. Army Research Laboratory
MH Ervin
Affiliation:
U.S. Army Research Laboratory
X Li
Affiliation:
Rensselaer Polytechnic Institute
A Cao
Affiliation:
Rensselaer Polytechnic Institute
PM Ajayan
Affiliation:
Rensselaer Polytechnic Institute

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 660 - 661
Copyright
© 2006 Microscopy Society of America