Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-30T04:51:29.107Z Has data issue: false hasContentIssue false
  • English
  • Français

Calculated X-ray Intensities Using Monte Carlo Algorithms: A Comparison To Experimental EPMA Data

Published online by Cambridge University Press:  01 August 2005

P Carpenter
P Carpenter
Affiliation:
NASA, Marshall Space Flight Center, Alabama

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1278 - 1279
Copyright
© 2005 Microscopy Society of America