Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-10T02:38:43.718Z Has data issue: false hasContentIssue false
  • English
  • Français

Bouncing Around Between Real and Reciprocal Space with Electrons and X-rays, an Adventure with John Spence.

Published online by Cambridge University Press:  22 July 2022

Peter Rez
Peter Rez*
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Memorial Symposium: John C.H. Spence
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2750 - 2751
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Spence, J.C.H., “Experimental High Resolution Electron Microscopy”, (OUP , 1977)Google Scholar
Spence, J.C.H. and Cowley, J.M., Optik, 50, 129, (1978)Google Scholar
Amali, A. and Rez, P., Microsc. Microanal, 3, 28, (1997)10.1017/S1431927697970021CrossRefGoogle Scholar
Spence, J.C.H and Tafo, J., J. Microsc, 130, 147, (1983)10.1111/j.1365-2818.1983.tb04213.xCrossRefGoogle Scholar
Zuo, J.M., et al. , Nature, 301, 49, (1999)10.1038/43403CrossRefGoogle Scholar
Chapman, H.N, et al. , Nature, 370, 73, (2011)10.1038/nature09750CrossRefGoogle Scholar
Donatelli, J.J. and Spence, J.C.H., Phys Rev Lett, 125, 065502, (2020)10.1103/PhysRevLett.125.065502CrossRefGoogle Scholar