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Better Transparency and Conduction Via Alchemi: Site-Occupancy of Cations in Transparent Conducting Oxides (TCOs) Cd1+xIn2-2xsnxO4

Published online by Cambridge University Press:  02 July 2020

L.N. Brewer  and
Vinayak P. Dravid
L.N. Brewer
Affiliation:
Department of Materials Science and Engineering, Northwestern University 2225 N. Campus Dr., Evanston, IL60208
Vinayak P. Dravid
Affiliation:
Department of Materials Science and Engineering, Northwestern University 2225 N. Campus Dr., Evanston, IL60208
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Abstract

Transparent conductive oxide materials (TCO) are currently under development for use as electrodes in devices such as photovoltaics and flat panel displays. As electrode area increases in large-area applications (e.g. photovoltaics), the resistivity of the TCO must decrease in order to maintain efficiency. The ideal next generation TCO will be a low cost material with a substantially higher conductivity than ITO obtained by improving mobility. Two promising TCO's are CdIn2O2 and Cd2SnO4 which both exhibit high conductivities (4300 S/cm and 8300 S/cm, respectively) and high mobilities (44 and 60 cm2/Vs, respectively).

A bulk investigation of the system CdIn2O4 - Cd2SnO4 reveals a large spinel solid solution, Cd1+xIn2.2xSnxO4 (0<x<0.75) at 1175°C exhibiting a sharp decrease in measured optical gap (from 3.0 to 2.8 eV) at x=0.2 and an increase in conductivity (from 2200 S/cm to 3500 S/cm) for reduced specimens between x=0.4 and x=0.60) with increasing x. It is suspected that the cation distribution (e.g. normal, random, or inverse) on the spinel lattice may be important in understanding these shifts in electrical and optical properties.

Type
Atom Location by Channeling Enhancement of X-Ray and EELS Signals (ALCHEMI)(organized by J.Spence)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 336 - 337
Copyright
Copyright © Microscopy Society of America 2001

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References

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(4) This work was supported in part by the NSF-MRSEC under grant no. DMR-9632472 and by the U.S. Dept. of Energy (DE-FG02-92ER45475). LNB was personally supported by the Department of Defense-NDSEG. The authors also wish to acknowledge the helpful insights of Dr. I.M. Anderson of Oak Ridge National Laboratory, Prof. J.C.H. Spence of Arizona State University, Dan Kammler and Tom Mason (main collaborators) and G. Gonzalez of Northwestern University.Google Scholar