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Benefits of a Full Field of View in Atom Probe Tomography

Published online by Cambridge University Press:  22 July 2022

David A. Reinhard ,
Katherine P. Rice ,
Robert M. Ulfig ,
Isabelle Martin ,
Brian P. Geiser  and
David J. Larson
David A. Reinhard*
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Katherine P. Rice
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Robert M. Ulfig
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Isabelle Martin
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Brian P. Geiser
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
David J. Larson
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 706 - 708
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Copyright
Copyright © Microscopy Society of America 2022

References

Panayi, P., “Reflectron”, United States Patent 8,134,119, March 13, 2012.Google Scholar
Bostel, A. et al. , “High Resolution Wide Angle Tomographic Probe”, United States Patent 8,074,292, December 6, 2011.Google Scholar
Bunton, J. H. and Van Dyke, M. S., “Wide Field of View Atom Probe”, United States Patent 10,615,001, April 7, 2020.Google Scholar