No CrossRef data available.
Article contents
B, C, N and O analysis by EPMA-SXES
Published online by Cambridge University Press: 30 July 2021
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Many Detectors Make Lights Work: Advances in Microanalysis of Light Elements in Synthetic and Natural Materials
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
von der Handt, A., Mosenfelder, J., Dalou, C. and Hirschmann, M.M. (2019): Recent Advances in the Analysis of Nitrogen by EPMA. Microscopy and Microanalysis 25 (2), pp. 2320 – 2321. doi: 10.1017/S1431927619012339.CrossRefGoogle Scholar
von der Handt, A.,and Dalou, C. (2016): Quantitative EPMA of nitrogen in silicate glasses. Microscopy and Microanalysis 22 (S3), pp. 1810-1811. doi: 10.1017/S1431927616009892.CrossRefGoogle Scholar
Mosenfelder, J.L., Von Der Handt, A., Füri, E., Dalou, C., Hervig, R.L., Rossman, G.R. and Hirschmann, M.M., (2019). Nitrogen incorporation in silicates and metals: Results from SIMS, EPMA, FTIR, and laser-extraction mass spectrometry. American Mineralogist: Journal of Earth and Planetary Materials, 104(1), pp.31-46.Google Scholar
Nachlas, W., Baldwin, S., Thomas, J., & Ackerson, M. (2020). Investigation of N in Ammonium-bearing Silicates with Electron Probe Microanalysis (EPMA). Microscopy and Microanalysis, 26(S2), 42-43. doi:10.1017/S1431927620013203.CrossRefGoogle Scholar
Terauchi, M (2014): Valence Electron States of Carbon Materials studied by TEM-SXES. Microscopy and Microanalysis 20 (S3), pp. 896-897. doi:10.1017/S1431927614006205.CrossRefGoogle Scholar
Terauchi, M., Takahashi, H., Takakura, M., Murano, T., Koike, M., Imazono, T., M., Koeda (2016). Chemical States Analysis of Trace-boron by using an Improved SEM-SXES. Microscopy and Microanalysis, 22(S3), 414-415. doi:10.1017/S1431927616002920.CrossRefGoogle Scholar
von der Handt, A., Takahashi, H., Takakura, M., Dalou, C., Mosenfelder, J. and Hirschmann, M.M., (2018): Investigation of Nitrogen in Silicate Glasses and Iron Alloys by SXES. Microscopy and Microanalysis, 24(S1), pp.2024-2025. doi: 10.1017/S1431927618010607.CrossRefGoogle Scholar
von der Handt, A., and Mosenfelder, J. (2019): Soft X-ray Emission Spectroscopy of Borosilicate Glasses and Minerals by SXES and EPMA-WDS. Microscopy and Microanalysis 25 (3), pp. 270-271. doi: 10.1017/S1431927619002083.CrossRefGoogle Scholar
You have
Access