Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-23T17:51:51.441Z Has data issue: false hasContentIssue false
  • English
  • Français

Automation-Assisted Complementary Techniques for Multi-Spectroscopy TEM and STEM Spatially-Resolved Microanalysis

Published online by Cambridge University Press:  24 July 2003

A. Aitouchen ,
S. T. Kim  and
J. K. Weiss
A. Aitouchen
Affiliation:
Emispec, 2050 S. Cottonwood Dr., Tempe, AZ 85282
S. T. Kim
Affiliation:
Emispec, 2050 S. Cottonwood Dr., Tempe, AZ 85282
J. K. Weiss
Affiliation:
Emispec, 2050 S. Cottonwood Dr., Tempe, AZ 85282

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1002 - 1003
Copyright
Copyright © Microscopy Society of America 2003