Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T06:38:27.748Z Has data issue: false hasContentIssue false
  • English
  • Français

Automatic FIB-SEM Preparation of Straight Pillars for Micro-Compression Testing

Published online by Cambridge University Press:  25 July 2016

Tobias Volkenandt ,
Alexandre Laquerre ,
Michal Postolski  and
Fabian Perez-Willard
Tobias Volkenandt
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Alexandre Laquerre
Affiliation:
Fibics Incorporated, Ottawa, Canada
Michal Postolski
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Fabian Perez-Willard
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 190 - 191
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Greer, J.R., et al., Acta Matenalia 53 (2005). p. 1821.Google Scholar
[2] Dimiduk, D.M., et al, Acta Materialia 53 (2005). p. 4065.Google Scholar
[3] Uchic, M.D. & Dimiduk, D.M. Mat Sci. Eng. A 400–401 (2005). p. 268.Google Scholar