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Automated Three-dimensional EBSD Analysis of Materials

Published online by Cambridge University Press:  01 August 2005

J J L Mulders  and
H L Fraser
J J L Mulders
Affiliation:
FEI Electron Optics, Eindhoven, The Netherlands
H L Fraser
Affiliation:
Ohio State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 506 - 507
Copyright
© 2005 Microscopy Society of America