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Automated Prediction of Pseudo-Symmetry Issues in EBSD

Published online by Cambridge University Press:  01 August 2018

P. G. Callahan ,
Saransh Singh ,
M. Echlin ,
J. C. Stinville ,
T. M. Pollock  and
Marc De Graef
P. G. Callahan
Affiliation:
Dept. of Materials, University of California at Santa Barbara, Santa Barbara, CA, USA
Saransh Singh
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh, PA, USA
M. Echlin
Affiliation:
Dept. of Materials, University of California at Santa Barbara, Santa Barbara, CA, USA
J. C. Stinville
Affiliation:
Dept. of Materials, University of California at Santa Barbara, Santa Barbara, CA, USA
T. M. Pollock
Affiliation:
Dept. of Materials, University of California at Santa Barbara, Santa Barbara, CA, USA
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh, PA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 566 - 567
Copyright
© Microscopy Society of America 2018 

References

[1] Callahan, P. G. Graef, M. De Microsc. MicroAnal. 19 2013) p. 1255.Google Scholar
[2] Chen, Y. H., et al., Microsc. MicroAnal. 21 2015) p. 739.Google Scholar
[3] The authors acknowledge ONR Vannevar Bush Faculty Fellowship support (N00014-16-1-2821) as well as the computational resources of the Materials Characterization Facility at CMU, grant MCF-677785.Google Scholar