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Automated Image Alignment and Distortion Removal for 3-D Serial Sectioning with Electron Backscatter Diffraction

Published online by Cambridge University Press:  23 September 2015

Amanda J. Levinson ,
David J. Rowenhorst  and
Alexis C. Lewis
Amanda J. Levinson
Affiliation:
Naval Research Laboratory, 4555 Overlook Avenue SW, Washington, DC 20375
David J. Rowenhorst
Affiliation:
Naval Research Laboratory, 4555 Overlook Avenue SW, Washington, DC 20375
Alexis C. Lewis
Affiliation:
Formerly Naval Research Laboratory, 4555 Overlook Avenue SW, Washington, DC 20375

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1673 - 1674
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Uchic, M.D., Groeber, M.A. & Rollett, A.D., JOM 63 (2011). p. 25.Google Scholar
[2] Echlin, M.P., Mottura, A., Torbet, C.J. & Pollock, T.M., Review of Scientific Instruments 83 (2012). p. 023701–023711.Google Scholar
[3] Nolze, G., Ultramicroscopy 107 (2007). p. 172.Google Scholar
[4] This work was funded by the Naval Research Laboratory under the auspices of the Office of Naval Research and from the Structural Metallics program of ONR.Google Scholar