Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T19:14:51.179Z Has data issue: false hasContentIssue false
  • English
  • Français

Automated Crystal Orientation Mapping with a Liquid-Cell TEM

Published online by Cambridge University Press:  30 July 2021

Eric Lang ,
Caitlin Taylor ,
Sarah Pratt ,
Tina Nenoff  and
Khalid Hattar
Eric Lang
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico, United States
Caitlin Taylor
Affiliation:
Los Alamos National Laboratory, United States
Sarah Pratt
Affiliation:
Sandia National Laboratories, United States
Tina Nenoff
Affiliation:
Sandia National Laboratories, United States
Khalid Hattar
Affiliation:
Sandia National Laboratories, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2232 - 2233
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Bauer, D., et al. Critical Materials Strategy, U.S. Department of Energy, 2010.Google Scholar
Grand, J., et al. The Journal of Physical Chemistry C, 122 (2018), 12573-12588.CrossRefGoogle Scholar
Parent, L. R., et al. ACS Nano, 6 (2012), 3589–3596.CrossRefGoogle Scholar
Prozorov, T., et al. Journal of the Royal Society Interface, 14 (2017), 20170464.Google Scholar
Evans, J. E., et al. Nano Letters, 11 (2011), 2809–2813.CrossRefGoogle Scholar
Ahmad, N., et al. ACS Nano, 13 (2019), 13333-13342.Google Scholar
Roth, O., et al. Journal of Nuclear Materials, 383 (2009), 231–236.Google Scholar
Kobler, A., et al. Ultramicroscopy, 173 (2017), 84-94.CrossRefGoogle Scholar
Woehl, T.J., et al. ACS Nano, 6 (2012), 8599-8610.CrossRefGoogle Scholar
Nielsen, M.H., et al. Microscopy & Microanalysis, 20 (2014), 425-436.CrossRefGoogle Scholar
Taylor, C.A., et al. Nanoscale Advances, 1 (2019), 2229.Google Scholar